Gjornâl Furlan des SiencisFriulian Journal of Science

No. 13 (2010): GFS
RASSEGNIS

La microscopie par scansion eletroniche (SEM) voli magjic pe sience dai materiâi

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  • ALESSANDRO BACHIORRINI
ALESSANDRO BACHIORRINI
Za Ordenari di Sience dai Materiâi, Universitât dal Friûl, Udin, Italie.

Peraulis clâf

  • Mecaniche de frature,
  • morfologjie,
  • microstruture,
  • microanalisi

Cemût citâ

[1]
BACHIORRINI, A. 2010. La microscopie par scansion eletroniche (SEM) voli magjic pe sience dai materiâi. Gjornâl Furlan des Siencis - Friulian Journal of Science. 13, 13 (Jan. 2010), 153–166.

Ristret

Se la microscopie otiche tradizionâl e à puartât a une prime grande rivoluzion tal savê sientific, e je la microscopie par scansion eletroniche (Scanning electron microscopy – SEM) la cause prime de evoluzion simpri plui imburide e straordenarie vude tai ultins setante agns de sience dai materiâi. Te rassegne a son ricuardadis lis resons dal sucès de SEM tal disvilup de sience dai materiâi e a son ilustrâts un pôcs di esemplis che a pandin la sô fuarce tal judâ a rivâ a distrigâ i berdeis de sience.

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Riferiments

  1. Shimizu K, Mitani T. (2010). New Horizons of Applied Scanning Electron Microscopy. Berlin - Heidelberg: Springer Verlag.
  2. Raj B., Bhanu Sankara Rao K. (2005). Frontiers in Materials Science. Bangalore: Universities Press.
  3. Goodhew P. J., Humphreys F. J., Beanland R. (2001). Electron microscopy and analysis. London - N.Y.: Taylor & Francis. Watt I. M. (1997). The principles and practice of electron microscopy. Cambridge – New York - Melbourne: Cambridge University Press.
  4. Wetzig K., Schulze D. (1995). In situ scanning electron microscopy in materials research. Berlin: Akademie Verlag.